ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,433, issued on July 14, was assigned to Tencent Technology (Shenzhen) Co. Ltd. (Shenzhen, China). "Noise reduction for lightmap" was invent... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,434, issued on July 14, was assigned to Sharp K.K. (Sakai City, Japan). "Image processing apparatus and image processing method" was invent... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,435, issued on July 14, was assigned to Imagination Technologies Ltd. (Kings Langley, Great Britain). "Adaptive sharpening for blocks of pi... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,436, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Gyeonggi-Do, South Korea). "Leveraging data distortion for synthesizi... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,437, issued on July 14, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Methods for generating correction function, image correct... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,438, issued on July 14, was assigned to The Board of Trustees of the Leland Stanford Junior University (Stanford, Calif.). "Systems and met... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,439, issued on July 14, was assigned to SHANDONG GOLDEN EMPIRE PRECISION MACHINERY TECHNOLOGY Co. LTD (Liaocheng, China). "Window inspectin... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,440, issued on July 14, was assigned to Aptiv Technologies AG (Schaffhausen, Switzerland). "Method for detecting artifacts in infrared (IR)... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,441, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Implementing image enhancement for improved defect detection" was in... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,442, issued on July 14, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system for detecting foreign material and scratch at e... और पढ़ें